Product Highlight

SPECTRO XEPOS ED-XRF Spectrometer

An elemental analyzer designed for demanding applications – the SPECTRO XEPOS energy dispersive X-ray fluorescence (ED-XRF) spectrometer redefines XRF analysis with exceptional new levels of performance.

The SPECTRO XEPOS spectrometer represents a quantum leap in energy dispersive X-ray fluorescence technology. It leads SPECTRO’s newest generation of ED-XRF instruments, providing breakthrough advances in multi-elemental analysis of major, minor, and trace element concentrations. New developments in excitation and detection deliver outstanding sensitivity and detection limits — yielding remarkable gains in precision and accuracy.

  • Outstanding sensitivity leads up to a factor 3 improved precision – the basis for high accuracy when analyzing minor to major element concentrations
  • Measure lower than ever: Adaptive excitation, advanced tube design and high-count throughput detection system result in significantly (typically a factor 3) lower limits of detection for a wide range of elements
  • Master the unknown: The Turboquant II software tool provides an unprecedented ability to analyze unknown samples, regardless if they are liquid, solid or powder – whether tree leaves, plastics, oil, granite or glass

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